Chen, Jingyi, Lei Yan, Shikai Wang, and Wenxuan Zheng. 2024. “Deep Reinforcement Learning-Based Automatic Test Case Generation for Hardware Verification”. Journal of Artificial Intelligence General Science (JAIGS) ISSN:3006-4023 6 (1):409-29. https://doi.org/10.60087/jaigs.v6i1.267.